GRX Technology Co, Ltd
Product
spring probe
2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
24.9mm Semiconductor Test Probe| 1.311mm dia 1A | Used Test Wafer

24.9mm Semiconductor Test Probe| 1.311mm dia 1A | Used Test Wafer

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
6.35mm Spring Probe | Chip Test | 0.58mm Dia 2A

6.35mm Spring Probe | Chip Test | 0.58mm Dia 2A

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
4.5mm Spring Probe | Semiconductor Test Socket Use | 0.58mm Dia 2A

4.5mm Spring Probe | Semiconductor Test Socket Use | 0.58mm Dia 2A

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
2.1mm Wafer Probe| 0.51mm dia 2A | For Probe Card

2.1mm Wafer Probe| 0.51mm dia 2A | For Probe Card

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
5.5mm Wafer Probe| 0.48mm dia 2A | For Semiconductor Test Socket

5.5mm Wafer Probe| 0.48mm dia 2A | For Semiconductor Test Socket

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
1.85mm Wafer Probe| 0.38mm dia 2A | IC Test

1.85mm Wafer Probe| 0.38mm dia 2A | IC Test

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
2.35mm Semiconductor Probe| 0.38mm dia 1A | IC Test Socket Application

2.35mm Semiconductor Probe| 0.38mm dia 1A | IC Test Socket Application

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
4mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

4mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
4mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

4mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
High-frequency Semiconductor Test Probe Double Headed Spring Probe

High-frequency Semiconductor Test Probe Double Headed Spring Probe

<p>High-frequency semiconductor testing probes for wafer validation, chip packaging, and communication electronics. Features ultra-low contact resistance (&lt;1mΩ) and 5-40GHz bandwidth, optimized for 5G, automotive, and IoT precision testing.</p>