GRX Technology Co, Ltd
Product
wafer probe card
5mm Wafer Probe| 0.91mm dia 2A | Chip test

5mm Wafer Probe| 0.91mm dia 2A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4.5mm Wafer Test Probe | 0.75mm Dia 2A | Chip Test

4.5mm Wafer Test Probe | 0.75mm Dia 2A | Chip Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4mm Spring Probe | Semiconductor Test Socket Use | 0.58mm Dia 2A

4mm Spring Probe | Semiconductor Test Socket Use | 0.58mm Dia 2A

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

10mm Wafer Probe| 0.48mm dia 2A | For Probe Card

10mm Wafer Probe| 0.48mm dia 2A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4mm Semiconductor Probe| 0.38mm dia 1A | For Probe Card

4mm Semiconductor Probe| 0.38mm dia 1A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

2.1mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

2.1mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

10mm Semiconductor Probe| 0.28mm dia 1A | IC Test

10mm Semiconductor Probe| 0.28mm dia 1A | IC Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4mm Semiconductor Probe| 0.2mm dia 1A | Wafer Prober Application

4mm Semiconductor Probe| 0.2mm dia 1A | Wafer Prober Application

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.