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Semiconductor Test Probe Moving both ends / Moving one

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Semiconductor Test P...

Semiconductor Test Probe Moving both ends / Moving one

Semiconductor Test Probe Moving both ends / Moving one

Semiconductor Test Probe Moving both ends / Moving one

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High-frequency semiconductor testing probes for wafer validation, chip packaging, and communication electronics. Features ultra-low contact resistance (<1mΩ) and 5-40GHz bandwidth, optimized for 5G, automotive, and IoT precision testing.

Product Name: Semiconductor Test Probe
Catalog Number: DE1-020BD57-02C0
Current Rating: 1A
Contact Resistance: 150 mohms max
Bandwidth: -0.27dB @ 19.6GHz
Inductace: 1.25nH
Captance: 1.67pF

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High-frequency Semiconductor Test Probe Double Headed Spring Probe

semiconductor prober Semiconductor Test Probe wafer probe Double ended probe wafer testing chip probe

Product Details
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High-frequency semiconductor testing probes for wafer validation, chip packaging, and communication electronics. Features ultra-low contact resistance (<1mΩ) and 5-40GHz bandwidth, optimized for 5G, automotive, and IoT precision testing.

Plunger Type

Electrical Rating

Current Rating:0.2 Amps

Contact Resistance:250 mohms max

Specification

Full Stroke:0.80mm

Rated Stroke:0.60mm

Spring Force:[email protected]

Mechanical Life Exceeds:200K

Shenzhen Gaorunxin Technology Co., Ltd

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Shenzhen Gaorunxin Technology Co., Ltd

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