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DSX221G SMD | MHz Band Crystal Resonators For Automotive

DSX221G SMD | MHz Band Crystal Resonators For Automotive

<p>DSX221G is 2520 SMD Crystal Resonators (12MHz-64MHz) with AEC-Q200 compliance, 0.75mm ultra-low profile, and superior heat resistance. Ideal for Bluetooth, GPS, Wi-Fi, RKE systems, and automotive safety controls. Reliable MHz-band solutions for precision and durability.</p>

14.05mm Semiconductor Probe| 1.68mm dia 1A | For Probe Card

14.05mm Semiconductor Probe| 1.68mm dia 1A | For Probe Card

<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>

24.9mm Semiconductor Test Probe| 1.311mm dia 1A | Used Test Wafer

24.9mm Semiconductor Test Probe| 1.311mm dia 1A | Used Test Wafer

<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>

31.5mm Semiconductor Test Probe| 1.27mm dia 1A | Wafer test

31.5mm Semiconductor Test Probe| 1.27mm dia 1A | Wafer test

<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>

8.2mm Semiconductor Test Probe| 1.2mm dia 1A | Chip test

8.2mm Semiconductor Test Probe| 1.2mm dia 1A | Chip test

<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>

10mm Wafer Probe| 1.01mm dia 2A | Chip test

10mm Wafer Probe| 1.01mm dia 2A | Chip test

<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>

5mm Wafer Probe| 0.91mm dia 2A | Chip test

5mm Wafer Probe| 0.91mm dia 2A | Chip test

<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>

10.1mm Wafer Probe| 0.85mm dia 2A | Chip test

10.1mm Wafer Probe| 0.85mm dia 2A | Chip test

<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>

2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>

4mm Semi Probe | 0.78mm Dia 2A | Used for Wafer Test

4mm Semi Probe | 0.78mm Dia 2A | Used for Wafer Test

<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>

5.85mm Semi Probe | 0.75mm Dia 2A | Used for Wafer Test

5.85mm Semi Probe | 0.75mm Dia 2A | Used for Wafer Test

<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>

4.5mm Wafer Test Probe | 0.75mm Dia 2A | IC Test Socket Application

4.5mm Wafer Test Probe | 0.75mm Dia 2A | IC Test Socket Application

<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>

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