GRX Technology Co, Ltd
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10mm Semiconductor Test Probe| 0.28mm dia 1A | Chip test

10mm Semiconductor Test Probe| 0.28mm dia 1A | Chip test

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
10mm Semiconductor Probe| 0.28mm dia 1A | IC Test

10mm Semiconductor Probe| 0.28mm dia 1A | IC Test

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
4mm Semiconductor Probe| 0.28mm dia 1A | Wafer Test

4mm Semiconductor Probe| 0.28mm dia 1A | Wafer Test

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
4mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

4mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
3.1mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

3.1mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
4mm Semiconductor Probe| 0.2mm dia 1A | Pd Alloy

4mm Semiconductor Probe| 0.2mm dia 1A | Pd Alloy

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
4mm Semiconductor Probe| 0.2mm dia 1A | Wafer Prober Application

4mm Semiconductor Probe| 0.2mm dia 1A | Wafer Prober Application

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
4mm Semiconductor Probe| 0.15mm dia 0.2A | Wafer Test

4mm Semiconductor Probe| 0.15mm dia 0.2A | Wafer Test

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
High-frequency Semiconductor Test Probe Double Headed Spring Probe

High-frequency Semiconductor Test Probe Double Headed Spring Probe

<p>High-frequency semiconductor testing probes for wafer validation, chip packaging, and communication electronics. Features ultra-low contact resistance (&lt;1mΩ) and 5-40GHz bandwidth, optimized for 5G, automotive, and IoT precision testing.</p>
Semiconductor Test Probe Moving both ends / Moving one

Semiconductor Test Probe Moving both ends / Moving one

<p>High-frequency semiconductor testing probes for wafer validation, chip packaging, and communication electronics. Features ultra-low contact resistance (&lt;1mΩ) and 5-40GHz bandwidth, optimized for 5G, automotive, and IoT precision testing.</p>
Tomita EER Type Ferrite Cores

Tomita EER Type Ferrite Cores

<p>The EER Cores have a good coupling position and a circular center column, which is convenient for winding and increases the winding area, so a transformer with high power and low leakage inductance can be designed.</p>
Tomita UU,UI Type Ferrite Cores

Tomita UU,UI Type Ferrite Cores

<p>U Cores has the characteristics of small impedance deviation, large output current, high inductance, and ability to suppress high-order harmonics.</p>
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